Hardware parameters |
|
Microsystem | Optical system | Finite mechanical barrel length |
Observation head | 45-degree hinged trinocular head (50mm -75mm), centered telescope, 100% clear light photography |
45-degree hinged binocular head (50mm -75mm), centering the telescope |
Eyepiece | WF10X/Ф20mm |
Long Working Distance Plan Achromat Objectives | Magnification | Numerical Aperture (N.A.) | Working Distance (W.D.) |
10× | 0.25 | 8.1 |
25× | 0.4 | 4.8 |
40×(S) | 0.6 | 3.3 |
Phase contrast objective | 10× | 0.25 | 8.1 |
Gain | 40×-400× |
Objective lens wheel | Quadruple inward revolving nosepiece |
Stage | Double-layer mobile platform: 200mmx152mm, moving range: 75mmx30mm |
Condenser | N.A.0.4 Abbe condenser, working distance 30mm, with filter holder |
Specimen holder | Φ68mm/Φ72 or 77mmX33mm culture vessel |
Phase contrast device | 10×Phase contrast ring plate center adjustable |
Focus mechanism | Coarse and fine coaxial focusing, with locking and limit device plate, fine movement scale value: 2μm, focusing range: 30mm |
Lighting system | Halogen lamp 6V/20W, adjustable brightness |
Total magnification | 4 times - 1600 times |
Camera system | Highest resolution | 2048×1536 |
Pixel size | 3.2μm×3.2μm |
Imaging element | 1/1.8 inch progress scan CMOS |
Frame rate | 6fps@2048×1536 / 10fps@1600×1200 / 15fps@1280×1024 / 30fps@640×480 |
Highest definition | 900 lines |
SNR | less than 42dB |
Sensitivity | 1.0V@550nm/lux/S |
Output method | USB2.0 |
Actual observation range | 1 micron - 3000 microns |
Software parameters |
Software function | Static collection | Capture the sample morphology as a high-definition BMP image |
Image processing | Use a variety of drawing tools for relatively simple processing of pictures |
Image stitching | Seamlessly splicing multiple pictures, in the particle test, more particles can be obtained to improve the representativeness of the test |
Particle Automated Toolset | There are 12 automatic processing tools, such as automatic removal of particle adhesion, automatic removal of miscellaneous points, automatic removal of incomplete particles, automatic filling of hollow areas of particles, automatic smoothing of particle edges, etc. |
Scale Calibration | After passing the national standard micrometer calibration, each test only needs to select the scale value corresponding to the objective lens to directly obtain the actual size value of the particle. |
Single particle data | More than 10 parameters such as cross-sectional area, volume, and aspect ratio can be directly analyzed on a single particle on the picture |
Task Management Mechanism | Strict task management mechanism enables users to manage all test data in an orderly manner. |
Report output | Output the test results as a report, and you can customize the report style. |
Overall distribution characteristic parameter | Characteristic parameters of particle distribution such as D10, D50 (median diameter), D90, D100, etc. |
Report parameters | Overall Frequency Distribution Cumulative Distribution | Data tables, graphs, histograms, etc. of frequency distribution and cumulative distribution of particles according to number, volume, area, etc. |
Statistical mean diameter | Common statistical average diameters such as Xnl, Xns, Xnv, Xls, Xlv, Xsv, etc. |
Shape parameter | More than 10 commonly used data to characterize particle shape, such as aspect ratio, bulkiness ratio, sphericity, surface ratio, specific surface area, circumscribed rectangle parameters, etc. |
Statistics | Directly obtain the number of observed particles |
Sample thumbnail | Ability to display sample thumbnails into reports |
Header input | Multiple information such as sample name, test unit, and dispersion medium can be entered into the report header |
Custom logo | Users can customize the LOGO and report name, so that the output report displays their own company information |